Nanonics Imaging is the premier innovator of AFM and NSOM systems in the SPM market. Since its inception in 1997 and throughout the last ten years we have introduced to the SPM market new concepts in system functionality which in turn have supported the pursuit of new areas of scientific application.
Scanning Probe Microscopy
- Atomic force microscopy (AFM)
- Ballistic electron emission microscopy (MFM)
- Cantilever sensors
- Lateral force microscopy (LFM)
- Magnetic force microscopy (MFM)
- Magnetic resonance force microscopy
- Near-field scanning optical microscopy (NSOM)
- Photon scanning tunneling microscopy (PSTM)
- Scanning ion conductance microscopy (SICM)
- Scanning tunneling microscopy (STM)
The Krishna P. Singh Center for Nanotechnology is a premier facility that integrates state-of-the-art nanotechnology equipment.
Designed by Weiss/Manfredi and due to open in 2013, the 78,000 gross square foot facility will house several multi-user experimental laboratories critical to advanced research and development in nanotechnology. The following connected sections comprise the major components of the building:
SPECS leads the way in state-of-the-art technology, cutting-edge components and individually designed complex systems for surface analysis.
SPECS forms a team of scientists and engineers with more than 100 employees engaged in the design and production of instruments for nanotechnology, material science and surface science in general.
For now over 25 years, know-how, experience, intensive contact to scientists from all over the world, customer orientation and reliable quality control have been the keys to SPECS success.