At Nano-C's core is an energy and environmentally efficient combustion-based process technology invented at MIT by Nano-C Founder and MIT Professor Emeritus, Jack B. Howard. Nano-C is the exclusive developer and owner of the advanced II-G technology which has enabled Nano-C to be a leader in the efficient production of high-quality fullerenic materials including C60, C70, C84 and fullerene black. Nano-C's II-G technology offers an order-of-magnitude improvement in performance when compared to its 1st-generation technology licensed to a Japanese company in 2001.
Scanning Electron Microscopy (SEM)
- Absorb electron imaging (AEI)
- Backscattered electron imaging (BEI)
- Cathodoluminescence (CL)
- Electron backspattered patterns (EBSP) and diffraction (EBSD)
- Electron beam induced current (EBIC)
- Electron channeling (ECP)
- Energy dispersive x-ray spectroscopy (EDS)
- Orientation imaging microscopy (OIM)
- Scanning deep level transient spectroscopy (SDLTS)
- Secondary electron imaging (SEI)
- SEM with polarization analysis (SEMPA)
- Thermal wave microscopy (Scanning electron-acoustic)
- Wavelength-dispersive spectroscopy (WDS)
FEI is a leading diversified scientific instruments company. It is a premier provider of electron and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. FEI's imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Angstrom (one-tenth of a nanometer) level.